|
|
|
|
|
ambiguity of a
rotation
|
die Zwei-, Mehr- oder Vieldeutigkeit
einer Drehung und somit einer Orientierung
|
l'ambiguïté d'une rotation
|
ACOM
|
Automated Crystal lattice Orientation Microscopy
|
ACOM, die Automatische
Kristall Orientierungs-Mikroskopie
|
la cartographie automatisée de l'orientation des cristaux
|
ANN
|
Artificial Neural Network
|
KNN, das Künstliche
Neuronale Netzwerk
|
réseau neuronal artificiel
|
|
anomalous absorption
|
die anomale
Absorption
|
l‘absorption anomale
|
|
angular coordinates
|
Winkelkoordinaten
|
les coordonnées
angulaires
|
|
approximation condition
|
die Näherungs-Bedingung
|
la condition
d'approximation
|
|
average value, mean value
|
der Mittelwert, gemittelter
Wert
|
la valeur moyenne
|
|
area detector: 2D (image) detector
|
der Flächendetektor
|
détecteur de zone : détecteur 2D (image)
|
BCC
|
Body-Centered Cubic crystal lattice
|
krz, kiz, bcc: das raumzentrierte
kubische Kristallgitter, das kubisch innenzentrierte Gitter
|
réseau cristallin cubique centré sur l'espace
|
|
binning: grouping of neighboring pixels to form
"super pixels"
|
das Binning: die Zusammenfassung
von Bildpunkten zu „Super-Pixel“
|
binning: regroupement
de pixels voisins pour former de "super pixels"
|
BKD
|
Backscatter Kikuchi Diffraction
|
BKD: die Rückstreu-ElektronenBeugung,
Kikuchi-Beugung in Rückstreuung
|
BKD : la diffraction de Kikuchi en électrons rétrodiffusés
|
BKP
|
Backscatter Kikuchi diffraction Pattern (see EBSP)
|
BKP: das Elektronen-Beugungsdiagramm
in Rückstreuung
|
BKP: Diagramme de
rétrodiffusion de Kikuchi = EBSP
|
|
Bloch wave
|
die Blochwelle
|
l'onde de Bloch
|
|
Bragg diffraction
|
die Braggsche Beugung
|
la diffraction de
Bragg
|
BF / DF
|
In Bright Field imaging
(BF), the central non-diffracted beam is selected for imaging. In Dark Field
imaging (DF) it is a diffracted beam.
|
HF, die Hellfeldabbildung
/
DF Dunkelfeldabbildung
|
l'imagerie en champ clair / sombre
|
BSE
|
BackScattered Electrons
|
Rückstreu-Elektronen
|
les électrons rétrodiffusés
|
CBED
|
Convergent Beam Electron Diffraction (to produce
Kossel-Möllenstedt patterns and Zone Axis patterns)
|
die (Weitwinkel-)Beugung
im konvergenten Bündel, CBED (Kossel-Möllenstedt und Zonenachsen-Diagramme)
|
CBED : la diffraction
électronique à faisceau convergent
|
|
conformal (= angle preserving) projection, Lambert
projection
|
die winkeltreue
Projektion, Lambert-Projektion
|
la projection
préservant les angles, projection de Lambert
|
COM
|
Crystal Orientation Map, Crystal Orientation
Map(ping)
|
die (Kristall-)Orientierungs-Kartographie
|
la cartographie de
l'orientation des cristaux
|
|
computer
|
der Computer, Rechner
|
l‘ordinateur
|
|
contamination: The impact of electrons causes the
formation of an unwanted hydrocarbon layer, which obscures the image and the
diffraction pattern.
|
die Kontamination
|
la contamination
|
|
crystal structure
|
die Kristallstruktur
|
la structure du
cristal, la structure cristalline,
|
|
Debye-Scherrer ring
|
der Debye(-Scherrer)-Ring
|
l'anneau de
Debye-Scherrer
|
|
diffraction contrast
|
der Beugungskontrast
|
contraste par
diffraction
|
|
dynamical diffraction
|
die dynamische
Beugung
|
la diffraction
dynamique
|
|
earing
|
die Zipfelbildung
|
earing
|
EBSD
|
Electron Back Scatter Diffraction: commercial term
for ACOM with the SEM (not to confound with other backscatter electron
diffraction techniques such as RHEED, LEED, ECP)
|
EBSD, die ElektronenRückstreuBeugung
|
EBSD
|
EBSP
|
Electron Back Scattered Pattern (= BKP)
|
das Elektronen-RückstreuDiagramm
|
EBSP : Diagramme de rétrodiffusion de Kikuchi = BKP
|
ECP
|
Electron Channeling Pattern: Backscatter electron
diffraction pattern produced with a pivoting beam
|
ECP, das Elektronen-Channeling-Diagramm
|
ECP : Diagramme de canalisation des électrons
|
EDS, EDX
|
Energy Dispersive X -ray Spectroscopy
|
Energiedispersive
Röntgenspektroskopie, EDS, EDX
|
EDS, EDX
|
|
elastically scattered electrons
|
elastisch gestreute
Elektronen
|
électrons diffusés élastiquement
|
|
electron gun
|
die Elektronenquelle
|
la source d'électrons
|
|
Equal area projection
|
die flächentreue
Projektion, flächengleiche Projektion
|
la projection de surface réelle
|
(φ1, Φ, φ2)
|
Euler(ian) angles are used to represent the
orientation of a crystal with respect to a Cartesian reference frame
|
die Euler-Winkel
|
les angles d'Euler
|
Euler Map
|
COM using the Euler angles for color coding
|
Euler-Kartographie
|
Euler Map
|
|
Ewald sphere
|
die Ewaldkugel
|
la boule d'Ewald
|
|
Excitation error
|
der Anregungsfehler
|
l'erreur d'excitation
|
FCC
|
Face-Centered Cubic crystal lattice
|
kfz, fcc: das kubisch
flächenzentrierte Kristallgitter
|
FCC
|
|
fluorescent screen: see phosphor screen
|
|
|
FIB
|
Field Ion Beam: a source of field-emitted ions,
typically gallium or helium, that is used to build a stand-alone scanning ion
microscope or as a companion device to a (dual-beam) SEM
|
FIB, der Feldionen-Strahl,
die -Sonde
|
FIB: La sonde ionique focalisée
|
FSE
|
Forward Scattered Electrons
|
FSE,
vorwärtsgestreute Elektronen
|
FSE, les électrons
diffusés vers l'avant
|
|
Friedel’s law
|
die Friedelsche
Regel, das Friedelsche Gesetz
|
la règle de Friedel, le loi de Friedel
|
|
Gaussian distribution
|
die Gaussverteilung
|
la distribution gaussienne
|
GB
|
a Grain Boundary
is the interface between two crystals of the same composition and crystal
structure, but of different orientation.
|
KG, die Korngrenze
|
le joint de grains
|
GND
|
Geometrically Necessary Dislocations
|
GND, geometrisch
notwendige Versetzungen
|
GND, les dislocations géométriquement nécessaires
|
HCP
|
Hexagonal Close-Packed crystal lattice
|
hdp, hcp: die
hexagonal dichteste Kugelpackung
|
HCP
|
HT
|
Hough Transform(ation), an image processing and
analysis routine used to locate straight lines in a binary image. HT is a
special case of RT.
|
die Hough-Transformation
|
la transformation de
Hough
|
|
inelastically scattered electrons
|
inelastisch (auch:
unelastisch) gestreute Elektronen
|
électrons diffusés
inélastiquement
|
HOLZ
|
High Order Laue Zone
|
HOLZ, die Laue-Zone höherer
Ordnung
|
HOLZ, la zone de Laue
d'ordre élevé
|
|
information depth : The depth of the layer below the sample surface
from which the information is collected.
|
die Informationstiefe, IT
|
la profondeur de l'information
|
IPF
|
The inverse pole figure IPF represents the density distribution of
crystallographic directions <uvw> parallel to a sample direction in the
standard triangle of stereographic projection.
|
IPF, die inverse
Polfigur
|
IPF, la figure de pôles inverse
|
IQ
|
Image Quality (see PQ)
|
IQ, entspricht
ungefähr der PQ
|
IQ, la qualité d'image, comparable à PQ
|
|
Indexing Quality: a measure of the angular
deviations between detected and recalculated band positions
|
ein
Zuverlässigkeitswert für die Indizierung
|
une valeur de fiabilité de l'indexation
|
|
keyboard
|
Tastatur
|
le clavier
|
|
kinematical diffraction
|
die kinematische
Beugung
|
la diffraction cinématique
|
|
Kikuchi band
|
das Kikuchi-Band
|
la bande de Kikuchi
|
|
Kikuchi pattern
|
das Kikuchi-Diagramm
|
le diagramme de Kikuchi
|
L
|
camera length: distance from the beam spot on the
specimen to the pattern center on the phosphor screen
|
die Beugungslänge L
|
la distance L de diffraction
|
|
Laue pattern
|
das Laue-Diagramm
|
le diagramme de Laue
|
|
Lankford parameter, strain ratio
|
der r-Wert, das Dehnungsverhältnis
|
le paramètre de Lankford, rapport de déformation
|
LEED
|
Low Energy Electron Diffraction: Backscatter
electron diffraction with a primary beam of usually less than 5 keV at normal
incidence on a bulk crystal
|
LEED
|
LEED
|
|
materialography
is the study of the physical structure and components of solids, by using
microscopy and methods of sample preparation. Metallography is focused on
metals.
|
die Materialografie
|
matérialographie
|
Miller Map
|
COM using the Miller Indices of two reference
directions for color coding
|
die Miller-Kartographie
|
la cartographie de
Miller
|
|
microstructure
|
das Gefüge
|
microstructure
|
MBD
|
Micro Beam electron Diffraction: Electron
diffraction in transmission or backscattering mode with a fine-focused beam
spot
|
die Feinstrahl-Elektronenbeugung
|
la diffraction
électronique à faisceau fin
|
MODF
|
MisOrientation Distribution Function
|
die MODF, MOVF: die Missorientierungs-Verteilungsfunktion
|
MODF
|
|
nano-beam diffraction
|
die Feinststrahl-Beugung
|
la diffraction par
nanofaisceaux
|
|
normalization of data
|
das Normieren von
Daten
|
la normalisation des
données
|
OCF
|
Orientation Correlation Function
|
OCF, die Orientierungs-Korrelations-Funktion
|
OCF
|
ODF
|
Orientation Density Function, Orientation
Distribution Function
(definition:
dV(g)/V = f(g) dg )
|
die ODF, OVF: die Orientierungs-Dichtefunktion,
Orientierungs-Verteilungsfunktion
|
FDO : la Fonction de Densité d'Orientation f(g)
|
OIMTM
|
OIMTM is a registered trademark for an EBSD system
|
OIMTM
|
OIMTM
|
OM
|
Orientation Mapping, Orientation Microscopy
|
OM (= ACOM), die Orientierungs-Mikroskopie,
Orientierungs-Kartographie
|
OM (= ACOM)
|
|
Pendel loesung: In two-beam dynamical diffraction
the energy is periodically swinging like a "pendulum" from one beam
to the other at path lengths of half the extinction distance. Thus, the
intensity of the diffracted wave is not proportional to the scattering
amplitude of the reflection, but periodically changes with local specimen
thickness.
|
die Pendellösung
|
|
|
pixelated detector: digital 2D image detector
|
der Pixeldetektor: digitaler 2D-Bilddetektor
|
détecteur pixellisé : détecteur numérique d'images
2D
|
|
phosphor screen, fluorescent screen emits light
under the impact of electrons and thus makes the spatial image of electron
density visible.
|
der Leuchtschirm
|
l’écran phosphorent,
l’écran fluorescent
|
PF
|
(direct, standard) Pole Figure :
A pole figure hkl is the density of the poles {hkl}, often graphically
represented in stereographic or in
Lambert projection.
|
die (normale) Polfigur,
PF
|
PF, la figure de pôles (directe)
|
PF map
|
PF constructed by marking the individual grain
orientations (in color) on the reference sphere or on the Wulff's net, i.e.
the standard projection of the reference sphere.
|
die Polfigur-Kartographie, Richtungs-Kartographie
|
la cartographie de la
figure du pôle, la cartographie directionnelle
|
PB
|
A Phase Boundary is the interface between two
crystals of different crystal structure
|
die Phasengrenze
|
Le Joint de phases
|
|
point detector: 1D detector
|
der Punktdetektor, 1D-Detektor
|
|
PQ
|
Pattern Quality: a measure of the crispness of the
BKP and an indication of the perfectness of the diffracting crystal volume
|
PQ, die Patttern Quality
|
PQ
|
|
Preferred orientations, ideal orientations
|
die Vorzugsorientierungen, Ideallagen
|
les orientations préférées, les positions idéales
|
RT
|
Radon Transform(ation): an image processing and
analysis routine used to quantify gray-tone features in an image; in EBSD the
tool is to locate positions of Kikuchi bands in the BKP
|
RT, die Radon-Transformation
|
la transformation de
Radon
|
RHEED
|
Reflection High Energy Electron Diffraction, a special case of BKD,
in particular at steep to grazing beam incidence
|
die (Hochenergie-)Reflexions-Elektronenbeugung,
streifende Elektronenbeugung
|
RHEED , la diffraction à
incidence presque rasante du faisceau primaire
|
Rodrigues map
|
COM using the Rodrigues vector as parameters for
color coding
|
die Rodrigues-Kartographie
|
Rodrigues Map
|
SAD
|
Selected Area electron Diffraction: Electron
diffraction in the TEM using a selector aperture to limit the sampled area
|
die Feinbereichs-Elektronenbeugung, SAD
|
SAD, La diffraction en faisceau parallèle sur une zone
sélectionnée
|
SE
|
Secondary Electrons, by definition have an energy < 50 eV
|
die Sekundärelektronen, SE
|
les électrons secondaires
|
|
Skeleton line
|
die Skelett-Linie
|
|
SEM
|
Scanning Electron Microscope / Microscopy
|
das REM, das Raster-Elektronen-Mikroskop/ die -Mikroskopie
|
MEB : Microscope électronique à balayage
|
Σ value
|
reciprocal value of the fraction of the coincident
lattice sites of two superimposed crystal lattices
|
der Σ Wert
|
la valeur de Σ
|
|
stereology is the science that relates
three-dimensional structure to two-dimensional cross sections of materials.
|
die Stereologie
|
la stéréologie
|
|
Stereographic projection (an angle preserving
projection)
|
die Stereographische Projektion (winkeltreu)
|
|
t-EBSD, t-EFSD
|
t-EBSD,
t-EFSD : a TKD system on thin samples transparent to electrons in the
SEM
|
t-EBSD,
t-EFSD
|
t-EBSD,
t-EFSD
|
TEM
|
Transmission Electron Microscope / Microscopy
|
das TEM, das Transmissions-
/ Durchstrahlungs-Elektronen-Mikroskop, die Durchstrahlungs-Mikroskopie
|
MET : Microscope électronique à transmission
|
|
(crystallographic) texture: The statistics of the
preferential orientations of the grains in a specimen, the random
distribution is usually included.
|
die (kristallographische,
Kristall-) Textur
|
la texture (cristallographique)
|
TKD / TKP
|
Transmission Kikuchi Diffraction / Pattern
|
TKD, TKP, die Transmissions-Kikuchi-Beugung
/ das Transmissions-Diagramm
|
TKD / TKP : La diffraction de
Kikuchi en transmission
|
|
A twin(-crystal) or macle is an oriented
arrangement of several identical crystals, which are connected by a point
group symmetry operation.
|
der Zwilling
|
la macle
|
|
umweg anregung: Two
or more diffractions excite a kinematically forbidden reflection due to a
screw axis or a glide plane.
|
die Umweganregung
|
umweganregung,
l'excitation „umweg“
|
|
Wehnelt grid
|
der Wehneltzylinder
|
le cylindre de
Wehnelt, l'électrode de Wehnelt
|
XRD
|
X-Ray Diffraction
|
die Röntgenbeugung,
XRD
|
la diffraction de
rayons X
|
XRSA
|
X-Ray Residual Stress Analysis
|
die röntgenographische
Eigenspannungs-Analyse
|
l'analyse des
contraintes résiduelles par rayons X
|
XSA
|
X-Ray Scanning Apparatus
|
RRA, die Röntgen-Raster-Apparatur
|
l'appareil de
balayage à rayons X
|
|
Young fringes: Diffraction fringes in the
double slit experiment
|
die (Youngschen)
Beugungsstreifen
|
les lignes de
diffraction de Young
|
|
Young’s modulus
|
der Elastizitätsmodul,
der E-Modul
|
le
module d'élasticité E, le
module de Young
|
|
zone axis: A crystallographic direction with high atomic occupancy
density
|
die Zonenachse
|
l’axe de zone
|