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EBSD and BKD    

 

Glossary of Acronyms and Abbreviations
 

ACOM

Automated Crystal lattice Orientation Microscopy

BCC

Body-Centered Cubic crystal lattice

BKD

Back Scatter Kikuchi Diffraction

BKP

Back Scatter Kikuchi diffraction Pattern

CBED

Convergent Beam Electron Diffraction: Electron diffraction in the TEM with a wide-angular beam to produce Kossel-Möllendsted patterns  and Zone Axis patterns

COM

Crystal Orientation Map, Orientation Map(ping)

EBSD

Electron Back Scatter Diffraction: commercial term for ACOM with the SEM (not to confound with other backscatter electron diffraction techniques such as RHEED, LEED, ECP)

EBSP

Electron Back Scattered Pattern (= BKP)

ECP

Electron Channeling Pattern: Backscatter electron diffraction pattern produced with a pivoting beam

EDS, EDX

Energy Dispersive X -ray Spectroscopy for element analysis using characteristic X-rays that have been excited by the impact of an electron beam on a specimen

Euler Map

COM using the Euler angles for color coding

FCC

Face-Centered Cubic crystal lattice

HCP

Hexagonal Close-Packed crystal lattice

HT

Hough Transform(ation), an image processing and analysis routine used to locate straight lines in a binary image. HT is a special case of RT.

IPF

IPF constructed by marking the individual grain directions (in color) on the standard triangle of the crystal lattice

IQ

Indexing Quality: a measure of the angular deviations between detected and recalculated band positions

L

Camera Length: distance from the beam spot on the specimen to the pattern center on the phosphor screen

LEED

Low Energy Electron Diffraction: Backscatter electron diffraction with a primary beam of usually less than 5 keV at normal incidence on a bulk crystal

Miller Map

COM using the Miller Indices of two reference directions for color coding

MBD

Micro Beam electron Diffraction: Electron diffraction in transmission or backscattering mode with a fine-focused beam spot

MODF

MisOrientation Distribution Function

OCF

Orientation Correlation Function

PC

Pattern Center: the footpoint (x, y) of the perpendicular line from the phosphor screen to the point of beam impact on the specimen

PF

Pole Figure

PF map

PF constructed by marking the individual grain orientations (in color) on the reference sphere or on the Wulff's net, i.e. the standard projection of the reference sphere.

PQ

Pattern Quality: a measure of the crispness of the BKP and an indication of the perfectness of the diffracting crystal volume

RT

Radon Transform(ation): an image processing and analysis routine used to quantify gray-tone features in an image; in SEMdif Viewer the tool to locate positions of Kikuchi bands in the BKP

RHEED

Reflection High Energy Electron Diffraction = BKD, in particular at steep to grazing beam incidence

Rodrigues Map

COM using the Rodrigues vector as parameters for color coding

SAD

Selected Area electron Diffraction: Electron diffraction in the TEM using a selector aperture to limit the sampled area

SEM

Scanning Electron Microscope / Microscopy

S value

reciprocal value of the fraction of the coincident lattice sites of two superimposed crystal lattices

TEM

Transmission Electron Microscope / Microscopy

TKD / TKP

Transmission Kikuchi Diffraction / Pattern

XRD

X-Ray Diffraction