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Articles in Journals
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A1
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K.H. Gaukler and R. Schwarzer
Verbessertes Verfahren zur Bestimmung des mittleren
inneren Potentials aus Reflexions-Kikuchi-Diagrammen.
Optik 33 (1971) 215-229
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424
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A2
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K.H. Gaukler and R. Schwarzer
Elektronen-Emissions-Mikroskopie (Review article).
Messtechnik 81 (1973) 307-316
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1.190
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A3
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J. Hofmeister and R. Schwarzer
Zum Einfluß der kristallographischen Orientierung
auf den vektoriellen Photoeffekt.
Physics Letters 53A (1975)
283-284
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501
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A4
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G.H. Hartmann, H.P. Niemitz, and R.A. Schwarzer
Bestimmung des mittleren inneren Potentials von
Diamant und von Vanadium-Pentoxid aus Reflexions-Kikuchi-Diagrammen.
Optik 44 (1975) 37-43
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488
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A5
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R. Schwarzer
Der Einfluß von Loch- und Ringblenden auf die
Energieverteilung der Elektronen im Emissions-Elektronenmikroskop.
Optik 44 (1975) 61-78
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1.078
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A6
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R. Schwarzer
Die Verbesserung des Bildkontrastes im
Emissions-Elektronenmikroskop durch eine ringförmige Aperturblende.
Optik 44 (1975) 121-131
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533
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A7
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M.B. Trullenque, Z.P. Argüello, and R.A. Schwarzer
Investigations
of ionic crystals with the photoemission electron microscope.
Revista Microscopia Electrónica 3 (1976) 156-157
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252
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A7a
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R.A. Schwarzer,
J.I. Cisneros, M. Tomyiama, Shih-Lin Chang, and Z.P. Argüello
Study of
Orientation Contrast and Information Depth in LiF with the Photoemission
Electron Microscope (PEEM).
Revista de Microscopía Electrónica 5 (1978)
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288
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A8
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W.
May, E.A. Farah, and R. Schwarzer
EMA
and PEEM studies of WC-Ti interface reactions.
Revista Microscopia Electrónica 3 (1976) 190-191
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390
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A9
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R. Schwarzer and K.H. Gaukler
Erzeugung einer Ionen-Mikrosonde mittels
Feldionisation und Emissionslinse.
Vakuum-Technik 27 (1978) 2-5
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81
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A10
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R. Schwarzer
Die Bestimmung von Strukturpotentialen aus
Kossel-Möllenstedt-Diagrammen an epitaktisch aufgedampften, freitragenden
Kupfereinkristallschichten.
Optik 54 (1979) 193-199
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190
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A11
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R.A.
Schwarzer
Emission
electron microscopy - A review. Part 1: Basic concepts and applications in
physics.
Microscopica Acta 84 (1981) 51-86
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1.961
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A12
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R.A.
Schwarzer
Bestimmung von Polfiguren und Texturanalyse mit dem
Transmissions-Elektronenmikroskop.
Z. Metallkunde 73 (1982)
495-498
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507
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A13
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R.A.
Schwarzer
On-line
measurement of foil thickness from Kossel-Möllenstedt diffraction patterns.
Optik 77 (1987) 55-56
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179
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A14
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R.A. Schwarzer and H. Weiland
Texture analysis
by the measurement of individual grain orientations - Electron microscopical
methods and application on dual-phase steel.
Textures and Microstructures 8&9 (1988)
551-577
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1.459
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A15
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R.A.
Schwarzer
Measurement
of local textures with transmission and scanning electron microscopes.
Textures and Microstructures 13 (1990) 15-30
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1.502
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A16
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R. Schwarzer
Die Kristalltextur in der Mikroelektronik.
Teil 1. Elektronenmikroskopische Meßverfahren.
Verbindungstechnik in der Elektronik 3 (1991)
Heft 1, 16-20
Teil 2. Hügelbildung in dünnen
Metallisierungsschichten.
Verbindungstechnik in der
Elektronik 3 (1991) Heft 2, 56-59
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1.419
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A17
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R.A.
Schwarzer
A
review of the analysis of local texture by electron diffraction.
Textures
and Microstructures 14-18 (1991) 85-90
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799
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A18
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R.A.
Schwarzer
Scanning
X-ray apparatus for texture mapping by energy dispersive diffraction.
Textures and Microstructures 14-18 (1991)
241-244
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478
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A19
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R.A.
Schwarzer
Texture
analysis by electron diffraction.
Steel research 62 (1991) 542-547
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1.079
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A20
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D. Gerth, D. Katzer, and R. Schwarzer
Correlation
between grain growth and hillock growth in thin thermally annealed Al-1%Si
films on silicon substrates.
Materials Science Forum 94-96 (1992)
557-562 / Proc. Intern. Conf. on Grain Growth in Polycrystalline Materials,
Rome 1991
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273
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A21
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D. Gerth and R.A. Schwarzer
The
development of grain-specific texture and grain boundary character during
grain growth of Al-1%Si films on SiO2/Si substrates.
Materials Science Forum 113-115 (1993)
619-624 / Proc. Intern. Conf. on Recrystallization and Related Phenomena
(Recrystallization '92), San Sebastian 1992
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126
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A22
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D. Gerth and R.A. Schwarzer
The
effect of grain-specific texture on hillock growth in Al-1%Si films on SiO2/Si substrates.
Materials Science Forum 113-115 (1993)
625-630 / Proc. Intern. Conf. on Recrystallization and Related Phenomena
(Recrystallization '92), San Sebastian 1992
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246
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A23
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S. Zaefferer and R.A. Schwarzer
Microstructure
and local texture of partially recrystallized titanium sheet.
Materials Science Forum 113-115 (1993)
721-724 / Proc. Intern. Conf. on Recrystallization and Related Phenomena
(Recrystallization '92), San Sebastian 1992
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114
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A24
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R.A.
Schwarzer
Crystal
texture analysis of ceramics by electron microscopy.
Ceramika 42 (1993) 59-65 / Polski Biuletyn Ceramiczny 4 (1993)
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100
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A25
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R.A.
Schwarzer
The
determination of local texture by electron diffraction - A tutorial review.
Textures and Microstructures 20 (1993)
7-27
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3.495
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A26
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D. Gerth and R.A. Schwarzer
Graphical
representation of grain and hillock orientations in annealed Al-1%Si films.
Textures and Microstructures 21 (1993)
177-193
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774
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A27
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R.A. Schwarzer and D. Gerth
The
effect of grain orientation on the relaxation of thermomechanical stress in
Al-1%Si conductor layers on SiO2/Si substrates.
Journal of Electronic Materials 22 (1993)
607-610
https://doi.org/10.1007/BF02666405
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1.039
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A28
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R.A.
Schwarzer
Texture
distributions imaged by energy dispersive x-ray diffraction.
Steel
Research 64 (1993) 570-574
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1.157
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A29
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R.A.
Schwarzer
A
CCD camera system for the acquisition of backscatter Kikuchi patterns on an
SEM.
Materials
Science Forum 157-162 (1994) 187-188 / Proc. ICOTOM 10,
Clausthal 1993
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100
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A30
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R.A. Schwarzer and S. Zaefferer
An
inexpensive CCD camera system for recording and on-line interpretation of TEM
Kikuchi patterns.
Materials Science Forum 157-162 (1994)
189-194 / Proc. ICOTOM 10, Clausthal 1993
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312
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A31
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R.A. Schwarzer and S. Zaefferer
On-line
interpretation of SAD channeling patterns.
Materials Science Forum 157-162 (1994)
195-200 / Proc. ICOTOM 10, Clausthal, 1993
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176
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A32
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R.A.
Schwarzer
Preparation
of high-resistance or sensitive samples for grain orientation measurements
with electron microscopes.
Materials Science Forum 157-162 (1994)
201-206 / Proc. ICOTOM 10, Clausthal 1993
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272
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A33
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S. Zaefferer and R.A. Schwarzer
On-line
determination of complete deformation systems for cubic and hexagonal crystals
in the TEM.
Materials
Science Forum 157-162 (1994) 241-246 / Proc. ICOTOM 10, Clausthal 1993
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383
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A34
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S. Zaefferer and R.A. Schwarzer
On-line
interpretation of spot and Kikuchi patterns.
Materials
Science Forum 157-162 (1994) 247-250 / Proc. ICOTOM 10, Clausthal 1993
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188
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A35
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W. Xia and R.A. Schwarzer
PC
program for the calculation of ODF from SAD pole figures or from individual
grain orientations.
Materials Science Forum 157-162 (1994)
487-492 / Proc. ICOTOM 10, Clausthal 1993
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300
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A36
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M. Barthel, D. Gerth, R.A. Schwarzer, P. Klimanek,
and U. Messerschmidt
Individual
grain orientation relations after high-speed hot rolling of steel rods.
Materials Science Forum 157-162 (1994)
1131-1136 / Proc. ICOTOM 10, Clausthal 1993
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479
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A37
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D. Gerth, S. Zaefferer, and R.A. Schwarzer
Stress-induced
grain growth in thin Al-1% Si films on SiO2/Si substrates.
Materials
Science Forum 157-162 (1994) 1205-1210 / Proc. ICOTOM 10, Clausthal
1993
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1.304
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A38
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K.
Helming and R.A. Schwarzer
Texture
estimate from minimum ranges of SAD pole figures.
Materials
Science Forum 157-162 (1994) 1219-1224 / Proc. ICOTOM 10, Clausthal
1993
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264
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A39
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S. Zaefferer, D. Gerth, and R.A. Schwarzer
Determination
of local texture and deformation systems in TiAl6V4 and T40.
Materials Science Forum 157-162 (1994)
1319-1324 / Proc. ICOTOM 10, Clausthal 1993
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523
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A40
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D. Gerth and R.A. Schwarzer
Local
mechanical properties in thin Al layers on Si substrates calculated from
measured grain orientations.
Materials
Science Forum 157-162 (1994) 1571-1576 / Proc. ICOTOM 10, Clausthal
1993
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240
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A41
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K. Helming, R.A. Schwarzer, B. Rauschenbach, S. Geier,
B. Leiss, H.-R. Wenk, K. Ullemeyer, and J. Heinitz
Texture
estimates by means of components.
Z. Metallkunde 85 (1994)
545-553
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1.627
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A42
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M. Wehrhahn and R.A. Schwarzer
Crystal
texture mapping by energy dispersive x-ray diffraction.
Z. Metallkunde 85 (1994)
581-584
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321
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A43
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S. Zaefferer and R.A. Schwarzer
Automated
measurement of single grain orientations in the TEM.
Z. Metallkunde 85 (1994)
585-591
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403
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A44
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D. Gerth, D. Katzer, and R.A. Schwarzer
The
influence of local thermomechanical stress on grain growth in thin Al-1%Si
layers on SiO2/Si substrates.
Physica status solidi (a) 146 (1994)
299-316
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1.360
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A45
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R.A. Schwarzer and S. Zaefferer
Automated
measurement of grain orientations and on-line determination of complete
deformation systems with a TEM.
Advances in X-Ray Analysis 38 (1995)
377-381
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235
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A46
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R.A. Schwarzer and M. Wehrhahn
Scanning
x-ray apparatus for crystal texture mapping and micro-fluorescence analysis.
Advances in X-Ray Analysis 38 (1995)
383-385
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115
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A47
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R.A. Schwarzer, S. Zaefferer, and K. Kunze
The
characterization of microtexture by orientation mapping.
Advances
in X-Ray Analysis 38 (1995) 547-550
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144
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A48
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K. Helming, B. Rauschenbach, and R.A. Schwarzer
Analysis
of crystallographic texture in small sample areas.
Textures
and Microstructures 26-27 (1996) 111-124
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899
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A49
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R.A.
Schwarzer
The study of crystal texture by electron diffraction
on a grain-specific scale.
Microscopy and Analysis 45 (1997)
35-37
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1.574
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A50
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R.A. Schwarzer and M. Wehrhahn
X-ray
scanning apparatus for mapping texture and element distributions.
Textures and Microstructures 29 (1997)
65-76
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918
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A51
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R.A.
Schwarzer
Advances
in crystal orientation mapping with SEM and TEM.
Ultramicroscopy 67 (1997) 19-24
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444
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A52
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R.A.
Schwarzer
Review Paper: Automated crystal
lattice orientation mapping using a computer-controlled SEM.
Micron
28 (1997) 249-265
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702
1.585
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A53
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R.A. Schwarzer and J. Sukkau
Automated crystal orientation
mapping (ACOM) with a computer-controlled TEM by interpreting transmission
Kikuchi patterns.
Materials
Science Forum 273-275 (1998) 215-222
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702
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A54
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B. Schäfer and R.A. Schwarzer
SAD pole figures in transmission
and reflection using a high-grade CCD camera as an area detector.
Materials
Science Forum 273-275 (1998) 223-228
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137
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A55
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A.H. Fischer and R.A. Schwarzer
X-ray pole figure measurement and
texture mapping of selected areas using an x-ray scanning apparatus.
Materials Science Forum 273-275 (1998)
255-262
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547
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A56
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A.H. Fischer, D. Weirauch, and R.A. Schwarzer
Peltier-cooled
solid state drift-chamber detector for energy dispersive x-ray pole-figure
measurement and texture mapping.
Materials Science Forum 273-275 (1998)
263-269
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670
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A57
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A.
Huot, R.A. Schwarzer, and J.H. Driver
Texture
of shear bands in Al-Mg3% (AA5182) measured by BKD.
Materials Science Forum 273-275 (1998)
319-326
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493
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A58
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A. Ziegenbein, H. Neuhäuser, J. Thesing, R. Ritter,
H. Wittich, E. Steck, F. Springer, and R.A. Schwarzer
Investigations
on local plasticity of CuAl polycrystals by in-situ observations and FEM
simulations.
Materials Science Forum 273-275 (1998)
363-368
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264
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A59
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M. Lepper, A. von Glasow, D. Piscevic, and R.A.
Schwarzer
Crystal
texture and electromigration damage in Al-based interconnect lines studied by
ACOM with the SEM.
Materials Science Forum 273-275 (1998)
573-577
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193
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A60
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A.H. Fischer and R.A. Schwarzer
Mapping
of local residual strain with an x-ray scanning apparatus.
Materials Science Forum 273-275 (1998)
673-677
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128
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A61
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R.A.
Schwarzer
Local
crystal textures: experimental techniques and future trends.
Fresenius J. Anal. Chem. 361 (1998)
522-526
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451
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A62
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R.A.
Schwarzer
Crystallography
and microstructure of thin films studied by X-ray and electron diffraction.
Materials
Science Forum 287-288 (1998) 23-60
Proc. 6th Intern. Symposium on Trends and New
Applications of Thin Films, Regensburg 18 - 20 March 1998
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911
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A63
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R.A.
Schwarzer
Automated
crystal orientation mapping (ACOM) - a new perspective on the
characterization of microstructure.
Bulletin
Czech and Slovak Crystallographic Association 5 (1998) 35-36 (Special
Issue A - ECM-18)
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89
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A64
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H.J. Bunge and R.A. Schwarzer
Orientierungsstereologie - ein neuer Zweig der Texturforschung.
TU Contact 2 (1998)
67-73
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2.093
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A65
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S. Kittelberger, U. Bolz, R.P. Huebener, B.
Holzapfel, L. Mex, and R.A. Schwarzer
Transient
local resistivity maximum during temperature dependent oxygen diffusion in
YBa2Cu3O7-d thin films.
Physica C 312 (1999)
7-20
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2.887
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A66
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R. Schwarzer and A.H. Fischer
Ortsaufgelöste Textur- und Gitterdehnungsanalyse
mit einer Röntgenrasterapparatur.
TU
Contact 5 (1999) 49-53
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1.682
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A67
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R.A. Schwarzer and A. Huot
The
study of microstructure on a mesoscale by ACOM.
Crystal Research and Technology 35 (2000)
851-862
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208
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A68
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A.K. Singh and R.A. Schwarzer
Texture and anisotropy of mechanical properties in
Titanium and its alloys.
Z. Metallkunde 91 (2000) 702-716
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8.469
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A69
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R.A. Schwarzer, A.K. Singh, and J. Sukkau
Discrimination
and mapping of phase distributions by ACOM.
Materials
Science and Technology 16 (2000) 1389-1392
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1.657
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A70
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R.A.
Schwarzer
Measurement
of macro-texture by ACOM - an alternative to XRD.
Materials Science and Technology 16 (2000)
1384-1388
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1.556
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A71
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H.J. Bunge and R.A. Schwarzer
Orientation
stereology - a new branch in texture research.
Advanced Engineering Materials 3 (2001)
25-39
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669
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A72
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A.K. Singh and R.A. Schwarzer
Effect
of mode of deformation by rolling on the development of texture in binary
Ti-Mn alloys.
Scripta Materialia 44 (2001) 375-380
|
606
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A73
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A.K. Singh and R.A. Schwarzer
Texture
of hot rolled and annealed binary Ti-Mn alloys.
Z. Metallkunde 92 (2001)
184-190
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3.929
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A74
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A.K. Singh and R.A. Schwarzer
Evolution
of cold rolling texture in the binary alloys Ti-0.4Mn and Ti-1.8 Mn.
Materials Science and Engineering A307 (2001) 151-157
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349
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A75
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R.A.
Schwarzer
EBSD
studies of interconnect lines.
Revue de Métallurgie - SF2M - JA2001 (2001) 65
|
181
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A76
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R.A.
Schwarzer
Phase
discrimination by automated BKD.
Analytical and Bioanalytical Chemistry (ABC) 374
(2002) 699-702
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301
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A77
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R.A. Schwarzer and J. Sukkau
Automated
evaluation of Kikuchi Patterns by means of Radon and Fast Fourier
Transformations, and verification by an Artificial Neural Network.
Advanced Engineering Materials 5 (2003)
601-606
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268
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A78
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I.V.
Gervas’eva, B.K. Sokolov, R.A. Schwarzer, V.V. Gubernatorov, and Ya.V. Podkin
Effect
of the initial grain size on the structural inhomogeneity and texture
formation upon cold rolling and annealing of the Fe-3% Si alloy.
The Physics of Metals and Metallography 96 Suppl. 1 (2003) S43-S52
|
1.044
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A79
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R.A. Schwarzer
Automated grain orientation measurement by
backscatter Kikuchi diffraction.
The Physics of Metals and Metallography 96 Suppl. 1 (2003) S104-S115
|
811
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A80
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J. Pospiech, M. Ostafin, and R.A. Schwarzer
Microstructural aspects of crossrolling of
copper.
Inzynieria Matrialowa 24 (2003) 802-805
|
373
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A81
|
Z.
Jasienski, J. Pospiech, R. Schwarzer, A. Piątkowski, and A. Litwora
Inhomogeneity
of deformation induced by the change of deformation path in channel-die
compressed (112)[11-1] copper single crystals.
Inzynieria Matrialowa 25 (2004)
359-363
|
513
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A82
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Z.
Jasieński, J. Pospiech, A. Piątkowski, R. Schwarzer, A. Litwora, and M.
Ostafin
Textural
and structural effects of the change of deformation path in copper single
crystals in a channel-die test.
Archives of Metallurgy and Materials 49
(2004) 11-28
|
962
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A83
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R.A.
Schwarzer
Texture
in hot extruded, hot rolled and laser welded magnesium base alloys.
Solid State Phenomena 105 (2005) 23-28
|
310
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A84
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M. Ostafin, J. Pospiech, and R.A.
Schwarzer
Microstructure and texture in copper sheets after
reverse and cross rolling.
Solid State Phenomena 105 (2005)
309-314
|
404
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A85
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J. Pospiech, Z. Jasienski, M. Ostafin, and
R.A. Schwarzer
Local
and global effects in texture and microstructure observed after channel-die
compression of copper single crystals and after cross-rolling of copper
sheets.
Solid State Phenomena 105 (2005)
321-326
|
252
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A86
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R.A.
Schwarzer
Deformation
textures of fcc metals subjected to frictional and abrasive wear.
Solid State Phenomena 105 (2005)
195-200
|
119
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A87
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A.K. Singh and R.A. Schwarzer
Evolution
of texture in pure magnesium during rolling.
Z. Metallkunde 96 (2005)
345- 351
|
492
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|
A88
|
R.A.
Schwarzer
Advances
in the analysis of texture and microstructure.
Archives of Metallurgy and Materials 50 (2005) 7-20
|
278
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A89
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M. Ostafin, J. Pospiech and R.A.
Schwarzer
The
evolution of deformation texture in copper by unidirectional and by cross
rolling.
Archives of Metallurgy and Materials 50 (2005)
403-409
|
107
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A90
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R.A.
Schwarzer
Local
texture and back-end defect in hot extruded AZ91 magnesium alloy.
Z. Metallkunde 96 (2005)
1005-1008
|
260
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A91
|
R.A.
Schwarzer
Automated
crystal orientation measurement by backscatter Kikuchi diffraction.
Z. Kristallographie Suppl. 23 (2006) 163-168
|
108
|
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A92
|
J. Pospiech, M. Ostafin and R. Schwarzer
The
effect of the rolling geometry on the texture and microstructure in AZ31 and
copper.
Archives
of Metallurgy and Materials 51 (2006) 37-42
|
483
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A93
|
A.K. Singh and R.A. Schwarzer
Development
of cold rolling texture in the binary Ti-0.4Mn alloy.
Metals Materials and Processes 18
(2006) 351-360
|
578
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|
A94
|
B.K.
Sokolov, I.V. Gervas’eva, D.P. Rodionov, R.A. Schwarzer, and Ya.V. Podkin
Effect
of deformation inhomogeneities on the formation of texture during cold
rolling and annealing of nickel single crystals.
The
Physics of Metals and Metallography 102 (2006) 439-451
|
517
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A95
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R.A.
Schwarzer
The
preparation of Mg, Cd and Zn samples for crystal orientation mapping with BKD
in an SEM.
Microscopy
Today 15/March (2007) 40, 42
|
368
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|
A96
|
H.-G. Brokmeier, S. Lenser, R. Schwarzer, V.
Ventzke, S. Riekehr, M. Kocak, and J. Homeyer
Crystallographic
texture of dissimilar laser welded Al5083-Al6013 sheets.
Materials
Science Forum 539-543 (2007) 3894-3899
|
1.767
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A97
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A.K. Singh and R.A. Schwarzer
Evolution of texture during thermomechanical
processing of titanium and its alloys.
Trans. Indian Institute of Metals 61
(2008) 371-387
|
621
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A98
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R.A. Schwarzer
Spatial resolution in ACOM – What will come
after EBSD.
Microscopy Today 16/January (2008)
|
196
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|
A99
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R.A. Schwarzer
A fast ACOM/EBSD system.
Archives of Metallurgy and Materials 53 (2008) 5-10
|
155
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A100
|
R.A.
Schwarzer and J. Hjelen
High-speed orientation microscopy with
offline solving sequences of EBSD patterns.
Solid State Phenomena 160
(2010) pp 295-300
|
116
|
|
A101
|
R.A. Schwarzer
Orientation microscopy with Fast EBSD.
Materials
Science and Technology 26
(2010) 646-649
|
107
|
|
A102
|
J. Sukkau and R.A. Schwarzer
Reconstruction of Kikuchi patterns by
intensity-enhanced Radon transformation.
Pattern Recognition Letters 33 (2012)
739–743
|
390
|
|
A103
|
Robert A. Schwarzer and Johann Sukkau
Electron
Back Scattered Diffraction: Current state, prospects and comparison with
X-ray diffraction texture measurement.
The
Banaras Metallurgist 18 (2013) 1-11
|
219
|
|
A104
|
R. Schwarzer
Orientation
microscopy using the analytical scanning electron microscope.
Pract. Metallogr. 51 (2014) 160-179
|
422
|
|
A105
|
R.A.
Schwarzer and Jarle Hjelen
Backscattered Electron Imaging with an EBSD Detector.
Microscopy Today 23 (2015) 12-17
|
2.062
|
|
A106
|
R. Schwarzer and C. Esling
Texture et anisotropie des matériaux polycristallins - Cartographie par
diffraction de Kikuchi.
Techniques de l'ingénieur - Mise en forme des métaux et fonderie:
M3040 V2 (2021) 1-16 & DOC M3040 V2 (2021) 1-3 DOI 10.51257/a-v2-m3040
|
2.163
|
|
A107
|
C. Esling and R. Schwarzer
Texture et anisotropie des
matériaux polycrystallins - Diffraction RX, rayonnement synchrotron et
neutrons.
Techniques de l'Ingénieur - Mise en forme des métaux et
fonderie: M3039 v1 (2022) 1-32 & DOC M3039 v1 (2022) 1-3 DOI 10.51257/a-v1-m3039
|
(preprint)
(5984)
|
|
|
|
|
|
|
Conference Proceedings
|
|
|
|
|
|
|
C1
|
R. Schwarzer, W. Leiser, and K.H. Gaukler
Untersuchungen mit dem
Photoemissions-Elektronenmikroskop (PhEEM).
BEDO (= Beiträge zur elektronenmikroskop.
Direktabbildung von Oberflächen) 5 (1972) 977-986
|
400
|
|
C2
|
G. Möllenstedt and R. Schwarzer
Erste Erfahrungen mit einer Ringblende im
Emissions-Elektronenmikroskop Metioskop KE3.
BEDO 6 (1973) 495-506
|
419
|
|
C3
|
R. Schwarzer
Zur Abhängigkeit des Kontrastes in einem
Emissions-Elektronen-Mikroskop von Art und Größe der Aperturblende.
BEDO 7 (1974) 351-362
|
449
|
|
C4
|
U. Fritz and R. Schwarzer
Erhöhte Bildhelligkeit im
Photoemissions-Elektronenmikroskop Metioskop KE3 durch eine neuartige
Anodenplatte.
BEDO 9 (1976) 157-166
|
558
|
|
C5
|
J. Hofmeister and R. Schwarzer
Der vektorielle Photoeffekt im
Photoemissions-Elektronenmikroskop.
BEDO 9 (1976) 167-184
|
1.455
|
|
C6
|
R. Schwarzer
Transmissions-Kikuchi-Diagramme und Aufnahmen im
konvergenten Elektronenbündel an epitaktisch aufgedampften Kupferschichten.
EDO 10 (1977) 195-202
|
643
|
|
C7
|
K. Drescher and R. Schwarzer
Der Kontrast im Photoemission-Elektronenmikroskop
bei der Auslösung durch kurz- und langwellige UV-Strahlung.
BEDO 10 (1977) 735-744
|
1.240
|
|
C8
|
U. Fritz and R. Schwarzer
Erhöhung des Kontrastes und der Bildhelligkeit im
Photoemissions-Elektronenmikroskop durch Gasbelegungen auf Kupfer.
BEDO 10 (1977) 745-764
|
1.364
|
|
C9
|
R. Schwarzer and K.H. Gaukler
Long
working distance ion gun using a field-ionization source.
Proc. 7th Intern. Vacuum Congress & 3rd
Intern. Conference on Solid Surfaces, Vienna 1977, p. 2547-2549
|
93
|
|
C10
|
R. Schwarzer, J.I. Cisneros, and Z.P. Argüello
Messung der photoelektrischen Ausbeute und der
Energieverteilung von Photoelektronen aus LiF-Einkristallen im
Photoemissions-Elektronenmikroskop (PEEM).
BEDO 11 (1978) 209-214
|
341
|
|
C11
|
R.A.
Schwarzer
Physical
aspects of emission electron microscopy.
Proc. 1st EEM Conference, Tübingen 1979 /
BEDO 12/2 (1979) 3-38
|
1.304
|
|
C12
|
R.A.
Schwarzer
Evidence
for vectorial photoelectric effect from PEEM study of biological thin sections.
Proc. 1st EEM Conference, Tübingen 1979 /
BEDO 12/2 (1979) 165-170
|
805
|
|
C13
|
R.A.
Schwarzer
Determination
of fibre textures in thin gold films by evaluating pole figures with the TEM.
Proc. 10th Intern. Congress Electron
Microscopy, Hamburg 1982, Vol. 2, p. 129-130
|
557
|
|
C14
|
R. Schwarzer
Intensitätskorrektur für die Messung von Polfiguren
im TEM.
BEDO 16 (1983) 131-134
|
182
|
|
C15
|
R.A. Schwarzer and H. Weiland
Computer-aided
indexing of Kikuchi patterns from cubic, tetragonal, and hexagonal crystals
in the determination of grain orientations.
Proc. 8th Europ. Congr. EM (EUREM 1984),
Budapest 1984, p. 341-342
|
177
|
|
C16
|
R.
Schwarzer and H. Weiland
On-line
computerized evaluation of Kikuchi patterns for the determination of
preferred orientations and orientation correlations.
Proc. 7th Intern. Conf. on Textures of
Materials (ICOTOM 7), Holland 1984, p. 839-843
|
677
|
|
C17
|
H.
Weiland and R. Schwarzer
The
determination of preferred orientations with the TEM.
Proc. 7th Intern. Conf. on Textures of
Materials (ICOTOM 7), Holland 1984, p. 857-862
|
644
|
|
C18
|
H. Weiland and R. Schwarzer
On-line Auswertung von Kikuchi- und
Channelling-Diagrammen.
BEDO 18 (1985) 55-60
|
645
|
|
C19
|
R. Schwarzer
Polfigurmessung mit einem computergesteuerten
Transmissions-Elektronenmikroskop.
BEDO 18 (1985) 61-68
|
471
|
|
C20
|
H.
Weiland and R. Schwarzer
Automated
polefigure measurements and determination of single grain orientations with a
computer-controlled TEM.
Proc. 6th Intern. Congress Electron
Microscopy, Kyoto 1986, p. 451
|
68
|
|
C21
|
R.A. Schwarzer and H. Weiland
Preferred
crystal orientations studied with a computer-controlled transmission electron
microscope.
Proc. Intern. Symposium on Electron Optics
(ISEOB 86), Institute of Electronics, Academia Sinica, Beijing 1987, p. 222-224
|
27
|
|
C22
|
R.A. Schwarzer and H. Weiland
Measurement
of local textures by electron diffraction - Comparison with X-ray texture
analysis.
Proc. 8th Intern. Conf. on Textures of
Materials (ICOTOM 8), Santa Fe 1987, p. 203-208
|
252
|
|
C23
|
H. Weiland, R.A. Schwarzer, and H.J. Bunge
The
textures of ferrite and martensite in a dual-phase steel - measured separately
by electron diffraction.
Proc. 8th Intern. Conf. on Textures of
Materials (ICOTOM 8), Santa Fe 1987, p. 953-958
|
229
|
|
C24
|
R.A.
Schwarzer
Quantitative
TEM pole-figures of deformed titanium.
Proc. 9th Europ. Congr. Electron Microscopy
(EUREM 88), York 1988, Inst. Physics Conf. Series No. 93 (1988), Vol.
2, p. 23-24
|
260
|
|
C25
|
L.M.
Matthews and R.A. Schwarzer
Orientation
determination of ferrite and lath martensite in a dual phase steel containing
12% Cr.
Proc. 9th Europ. Congr. Electron Microscopy
(EUREM 88), York 1988, Inst. Physics Conf. Series No. 93 (1988), Vol.
2, p. 497-498
|
92
|
|
C26
|
R. Schwarzer
Die Aufnahme von Reflexions-Kikuchi-Diagrammen im
REM mit einer peltiergekühlten, integrierenden CCD-Videokamera.
BEDO 22 (1989) 279-282
|
208
|
|
C27
|
R. Schwarzer
Röntgen-Rasterapparatur zur Aufnahme von
Textur-Verteilungsbildern mittels energiedispersiver Beugung.
BEDO 22 (1989) 283-288
|
281
|
|
C28
|
R. Schwarzer
Die Ermittlung von Einzelorientierungen und
Orientierungskorrelationen in Al-Sputterschichten.
BEDO 22 (1989) 357-360
|
233
|
|
C29
|
R.A.
Schwarzer
Scanning x-ray microscopy for texture mapping by
energy dispersive diffraction.
12th Intern. Congr. X-Ray Optics and
Microanalysis, (12th IXCOM), Cracow 1989, p. 205-208
|
626
|
|
C30
|
R.A.
Schwarzer
Electron
diffraction texture analysis.
Proc. 1st Intern. Symp. on Advanced Materials, Islamabad 1989, p.
65-70
|
714
|
|
C31
|
R. Schwarzer
Elektronenmikroskopische Messung der Kristalltextur
in IC-Metallisierungsschichten.
6. Tagung Festkörperanalytik,
Karl-Marx-Stadt 1990, Tagungsband 7/1990 der TU Karl-Marx-Stadt, p. 70-71
|
83
|
|
C32
|
R. Schwarzer
Abbildende Röntgen-Rasterapparatur mit ED Beugung
für Textur- und RF-Analysen.
6. Tagung Festkörperanalytik,
Karl-Marx-Stadt 1990, Tagungsband 7/1990 der TU Karl-Marx-Stadt, p. 72-73
|
78
|
|
C33
|
R. Schwarzer
Röntgen-Rasterapparatur zur Abbildung von Texturfeldern
mittels ED Beugung und zur RF-Analyse.
Proc. Arbeitskreis
Röntgentopographie 1990 (Röto 90), p. 48-54
|
737
|
|
C34
|
R. Schwarzer
Kristalltextur und Hügelbildung in
Dünnschichtmetallisierungen.
Proc. 5th Intern. Conference on
Interconnection Technology in Electronics, Fellbach 1990, p. 73-76
|
258
|
|
C35
|
R.A. Schwarzer and H. Weiland
Electron
microscopy for the determination of preferred crystal orientations - A
concise review.
Proc. 12th Intern. Congr. for Electron
Microscopy, Seattle 1990, Vol. 4, p. 434-435
|
|
|
C36
|
S. Zaefferer and R. Schwarzer
Automatisierte Messung von Einzelorientierungen im
TEM.
BEDO 27 (1994) 159-168
|
555
|
|
C37
|
K. Kunze, S. Zaefferer, and R. Schwarzer
Orientierungs-Mapping mit dem
Raster-Elektronenmikroskop.
BEDO 27 (1994) 169-176
|
449
|
|
C38
|
R.A. Schwarzer, K. Kunze and S. Zaefferer
The
determination of microscale crystal texture.
Proc.
1st Slovene-German Seminar on Joint Projects in Materials Science and
Technology,
Portoroz, 1994, ed. FZ Jülich,
p. 41-46 ISBN 3-89336-155-3
|
355
|
|
C39
|
R.A. Schwarzer, F. Springer, and S. Zaefferer
Crystal
orientation mapping by digital beam scan and automated interpretation of
backscatter Kikuchi patterns in the SEM.
Proc. 11th Intern. Conf. on Textures of
Materials (ICOTOM 11), Xi'an (China) 1996, 43-52
|
1.089
|
|
C40
|
R.A. Schwarzer, N.C. Krieger Lassen, and B. Schäfer
Electron
texture goniometer consisting of a TEM with side-entry goniometer and a CCD
camera as an area detector.
Proc. 11th Intern. Conf. on Textures of
Materials (ICOTOM 11), Xi'an (China) 1996, 170-175
|
299
|
|
C41
|
R.A. Schwarzer and M. Wehrhahn
Principles
and applications of energy-dispersive x-ray diffraction texture imaging.
Proc. 11th Intern. Conf. on Textures of
Materials (ICOTOM 11), Xi'an (China) 1996, 176-181
|
1.766
|
|
C42
|
F. Wagner, P. Obringer, R.A. Schwarzer, G. Goaer,
and D. Sarti
The
variation of microstructure in a polycrystalline silicon ingot.
Proc. 11th Intern. Conf. on Textures of
Materials (ICOTOM 11), Xi'an (China) 1996, 1406-1409
|
46
|
|
C43
|
R.A.
Schwarzer
Automated
crystal orientation mapping (ACOM) of thin metallization layers and
interconnects.
Proc.
MRS 1997 Spring Meeting, Symp. I, San Francisco, March 31-April 4, 1997
Materials Research Society Symposium
Proceedings Volume 472 (1997)
281-292
|
1.149
|
|
C44
|
A.H. Fischer, K. Helming, and R.A. Schwarzer
Ortsaufgelöste Gefüge- und Texturanalyse mit einer
Röntgenrasterapparatur auf der Basis eines Philips X'Pert MRD-Systems.
Tagungsband 9.
Philips-Symposium Röntgenbeugung 1998 in Velen, Philips Kassel 1998, 67-77
|
159
|
|
C45
|
R.A.
Schwarzer
Orientation
stereology by ACOM - A new means to characterize microstructure.
Proc. Intern. Materials Research Congress,
Cancun 98 (Mexico), Academia Mexicana de Ciencia de Materiales, Cuernavaca
1998, 90
|
18
|
|
C46
|
F. Springer and R.A. Schwarzer
Applications
of ACOM on bulk materials and thin films.
Proc. Intern. Materials Research Congress,
Cancun 98 (Mexico), Academia Mexicana de Ciencia de Materiales, Cuernavaca
1998, 90
|
|
C47
|
A. Huot and R.A. Schwarzer
Texture
of shear bands in Al-Mg3% (AA5182) and TiAl6V4 measured by BKD.
Proc. Intern. Materials Research Congress,
Cancun 98 (Mexico), Academia Mexicana de Ciencia de Materiales, Cuernavaca
1998, 91
|
|
C48
|
B. Schäfer and R.A. Schwarzer
Measurement
of SAD and RHEED pole figures by using a high-grade CCD camera as an area
detector in the TEM.
Proc. Intern. Materials Research Congress,
Cancun 98 (Mexico), Academia Mexicana de Ciencia de Materiales, Cuernavaca
1998, 92
|
|
C49
|
A.H. Fischer and R.A. Schwarzer
Mapping
of texture, lattice strain and element distributions with an x-ray scanning
apparatus.
Proc. Intern. Materials Research Congress,
Cancun 98 (Mexico), Academia Mexicana de Ciencia de Materiales, Cuernavaca
1998, 92-93
|
|
C50
|
R.A.
Schwarzer
Modern diffraction techniques for the structural
analysis of metal surfaces.
Handbuch Fachrahmenprogramm
Geospectra 99, Düsseldorf 1999, 42-43
|
163
|
|
C51
|
R.A.
Schwarzer
Development
of BKD hardware: Accomplishments and opportunities.
Proc.
Microscopy and Microanalysis '99, Oregon 1999.
Microscopy and Microanalysis 5, Suppl.
2, (1999)242-243
|
12
|
|
C52
|
R.A.
Schwarzer
Advancements
of ACOM and applications to orientation stereology.
Proc. 12th Intern. Conf. on Textures of
Materials (ICOTOM12), Montréal 1999, 52-61
|
366
|
|
C53
|
R.A. Schwarzer and A.H. Fischer
Mapping of lattice strain and texture
distributions with an x-ray scanning apparatus.
Proc. 12th Intern. Conf. on
Textures of Materials (ICOTOM 12), Montréal 1999, 204-210
|
213
|
|
C54
|
A. Huot, A.H. Fischer, A. von Glasow, and R.A.
Schwarzer
Quantitative
texture analysis of Cu damascene interconnects.
In: O.
Kraft, E. Arzt, C.A. Volkert, P.S. Ho and H. Okabayashi (eds.): Proc. 5th
Intern. Workshop on
Stress-Induced Phenomena in Metallization, MPI Stuttgart 1999. AIP Conference
Proceedings 491, Melville N.Y. 1999, 261-264 1563969041
|
174
|
|
C55
|
A.H. Fischer, A. von Glasow, A.
Huot and R.A. Schwarzer
Crystal
texture of electroplated damascene Cu interconnects.
Proc.
Advanced Metallization Conference 1999 (AMC), Orlando (Florida), Materials Research Society, 1999, 137-141
|
312
|
|
C56
|
P.P. Camus, D.B. Rohde, and R.A. Schwarzer
Considerations
for Multi-Phase and Low-Symmetry COM Analyses.
Microscopy and Microanalysis,
7 (S2) 2001, 362-363. DOI:10.1017/S1431927600027884
|
273
|
|
C57
|
R.A.
Schwarzer
The
characterization of microstructure by ACOM / EBSD and orientation stereology.
20th
European Crystallographic Meeting (ECM 20) Cracow 2001
Book
of Abstracts page 137 ISBN
83-88519-16-6
|
10
|
|
C58
|
J. Pospiech, R.A. Schwarzer, and K.
Wiencek
Data
Elaboration from Automatic Diffraction Measurement.
(in
Polish language: Komputerowe opracowanie danych z automatycznych pomiarów
dyfrakcyjnych.)
KomPlasTech 2003, Wisla
Jawornik, 2003, 215-222
|
425
|
|
C59
|
J. Pospiech, M. Ostafin and R.A.
Schwarzer
Tekstura i mikrostruktura (i ich
wzajemne relacje) po walcowaniu poprzecznym i diagonalnym.
(in Polish language: Texture and
microstructure (their mutual relation) after cross and oblique rolling. Seminar on the
occasion of Prof. Z. Jasienski’s 70th birthday)
in: Niejednorodności odkształcenia w
procesach przeróbki plastycznej i rekrystalizacji. Seminarium poświecone 70
rocznicy urodzin prof. Z. Jasieńskiego.PAN IMIM Kraków, 21
stycnia 2005, p. 49-59
|
|
|
C60
|
M. Søfferud, J.
Hjelen, M. Karlsen, T. Breivik, N.C. Krieger Lassen, and R.
Schwarzer
Development of an ultra-fast EBSD detector system.
in: M. Luysberg, K. Tillmann, T. Weirich
(Eds.), Proc. 14th European Microscopy Congress EMC2008 Vol.1:
Instrumentation and Methods, Aachen, 1-5 Sept. 2008, Springer Berlin
Heidelberg 2008 ISBN 978-3-540-85154-7
|
45
|
|
C61
|
R. Schwarzer and J. Sukkau
Reproduzierbare EBSD-Messung im REM durch
Pattern Streaming und off-line Auswertung.
Prakt. Metallographie Sonderband 45 (2013) 227-232
|
197
|
|
|
|
|
|
|
Books and various
publications
|
|
|
|
|
|
|
B1
|
R. Schwarzer
Der Einfluß von Loch- und Ringblenden auf den
Bildkontrast und die Energieverteilung der Elektronen im
Emissions-Elektronenmikroskop.
PhD Thesis, University of Tübingen (Germany),
1975
|
|
|
B2
|
R. Schwarzer
Die Bestimmung der lokalen Textur mit dem
Elektronenmikroskop.
Habilitation Thesis, Clausthal University of
Technology, 1989
|
|
|
B3
|
R.A. Schwarzer and H. Weiland
Electron
diffraction pole figure measurement.
in: H.J. Bunge (ed.): Experimental Techniques
of Texture Analysis. DGM-Verlagsgesellschaft, Oberursel and New York 1986, p.
287-300
|
1.149
|
|
B4
|
H.
Weiland and R. Schwarzer
On-line
texture determination by Kikuchi or channeling patterns.
in H.J. Bunge (ed.): Experimental Techniques
of Texture Analysis. DGM-Verlagsgesellschaft, Oberursel and New York
1986, p. 301-313
|
647
|
|
B5
|
R.A.
Schwarzer
Crystal
texture analysis by means of electron diffraction.
in
H.J. Bunge and C. Esling (eds.): Advances and Applications of Quantitative
Texture Analysis.
DGM-Verlagsgesellschaft,
Oberursel and New York 1991, p. 51-72
|
1.435
|
|
B6
|
R.A.
Schwarzer (ed.)
Proceedings
International Conference on Texture and Microstructure of Polycrystals,
ITAP-1, Clausthal 22 - 25 September 1997
Materials Science Forum 273-275(1998) ISBN:
0-87849-802-8
|
|
|
B7
|
R.A.
Schwarzer
Automated
electron backscatter diffraction: Present state and prospects.
in:
A. Schwartz, M. Kumar and B.L. Adams (eds.): Electron Backscatter Diffraction
in Materials Science, Kluwer Academic / Plenum Publishers, 2000, p.
105-122 ISBN: 0-306-46487-X
|
543
|
|
B8
|
R.A.
Schwarzer
Modern diffractions
techniques for texture analysis.
In R.K. Ray et al. (eds.): Materials for the
Third Millenium, Oxford & IBH Publ. Co., New Delhi 2001, p. 171-195
|
86
|
|
B9
|
C. Esling, M.
Humbert, R.A. Schwarzer and F. Wagner (eds.)
Proceedings
2nd International Conference on Texture and Microstructure of
Polycrystals, ITAP-2, Metz, July 7-9, 2004
Solid State Phenomena vol. 105 (2005) ISBN:
3-908451-09-4
|
|
|
B10
|
L. Spieß, R. Schwarzer, H.
Behnken and G. Teichert
Moderne Röntgenbeugung - Röntgendiffraktometrie für Materialwissenschaftler, Physiker
und Chemiker.
Teubner B.G. GmbH Verlag, 2005 ISBN: 3-519-00522-0
|
20.431
Chapter 11
2.655
|
|
B11
|
R.A. Schwarzer
Texture mapping by
scanning X-ray diffraction and related methods.
In: A.K. Singh (ed.):
Advanced X-ray Techniques in Research and Industry.
IOS Press, Amsterdam,
The Netherlands, 2005, p. 50-65 ISBN: 1-58603-537-1
Indian edition: Capital Publishing Company,
New Delhi, 2006 ISBN: 81-85589-41-0
|
634
|
|
B12
|
D. Rammlmair, M. Wilke, K. Rickers, R.A. Schwarzer,
A. Möller and A. Wittenberg
Methodological
Developments and Applications – 7.6 Geology, Mining, Metallurgy.
in: B.
Beckhoff, B. Kanngießer, N. Langhoff, R. Wedell and H. Wolff (eds.): Handbook
of Practical X-Ray Fluorescence Analysis.
Springer-Verlag Berlin
Heidelberg 2006, S.640-687 SBN 3-540-28603-9
|
1.208
|
|
B13
|
L. Spieß, G. Teichert, R. Schwarzer, H.
Behnken, and Ch. Genzel
Moderne Röntgenbeugung -
Röntgendiffraktometrie für Materialwissenschaftler, Physiker und Chemiker. 2nd edition
Vieweg + Teubner 2009 ISBN: 978-3-8351-0166-1
|
16.341
Chapt.
11&14
3.579
|
|
B14
|
H. Klein and R.A. Schwarzer
(eds.)
Proceedings
3rd International Conference on Texture and Microstructure of
Polycrystals, ITAP-3, Göttingen, 23-25 September 2009
Solid State Phenomena vol. 160 (2010) ISBN:
3-908451-78-7 ISBN-13 978-3-908451-78-5
|
|
|
B15
|
R.A. Schwarzer, D.P. Field, B.L. Adams, M. Kumar, and A.J. Schwartz
Chapter
1: Present State of Electron Backscatter Diffraction and Prospective Developments.
in: A.J.
Schwartz et al. (eds.): Electron Backscatter Diffraction in Materials
Science.
Springer Science+Business Media, New York (2009), p. 1-20
EAN: 9780387881355
ISBN-10:0-387-88135-2
|
546
|
|
B16
|
H.J. Bunge and R.A.
Schwarzer
Crystallographic
Texture and Plastic Anisotropy.
In: D. Banabic (ed.): Multiscale Modelling in Sheet Metal
Forming.
Springer Intern. Publishing Switzerland 2016, p. 47-78 ISBN 978-3-319-44068-2
|
1.194
|
|
B17
|
L. Spieß, G. Teichert, R.
Schwarzer, H. Behnken, and Ch. Genzel
Moderne Röntgenbeugung -
Röntgendiffraktometrie für Materialwissenschaftler, Physiker und Chemiker. 3nd edition
Spinger
Spektrum 2019 ISBN:
978-3-8348-1219-3
|
14.243
|
|
|
|
|
