EBSD and BKD
Glossary of Acronyms and Abbreviations

 

 

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ACOM

A utomated C rystal lattice O rientation M icroscopy

BCC

B ody- Centered C ubic crystal lattice

BKD

B ack Scatter K ikuchi D iffraction
BKP

B ack Scatter K ikuchi diffractionP attern

CBED C onvergent B eam E lectron D iffraction: Electron diffraction in the TEM with a wide-angular beam to produce Kossel-Möllendsted and Zone Axis Patterns
COM C rystal O rientation M ap, Orientation Map(ping)
EBSD E lectron B ack S catter D iffraction: commercial term for ACOM with the SEM (not to confound with other backscatter electron diffraction techniques such as RHEED, LEED, ECP)
EBSP E lectron Back Scattered P attern (= BKP)
ECP E lectron C hanneling P attern: Backscatter electron diffraction pattern produced with a pivoting beam
EDS, EDX E nergy D ispersive X -ray S pectroscopy for element analysis using characteristic X-rays that have been excited by the impact of an electron beam on a specimen
Euler Map COM using the Euler angles for color coding
FCC F ace- Centered C ubic crystal lattice
HCP H exagonal C lose- P acked crystal lattice
HT H ough T ransform(ation), an image processing and analysis routine used to locate straight lines in a binary image. HT is a special case of RT.
IPF IPF constructed by marking the individual grain directions (in color) on the standard triangle of the crystal lattice

IQ

I ndexing Q uality: a measure of the angular deviations between detected and recalculated band positions

L

camera L ength: distance from the beam spot on the specimen to the pattern center on the phosphor screen
LEED L ow E nergy E lectron D iffraction. Backscatter electron diffraction with a primary beam of usually less than 5keV at normal incidence on a bulk crystal
Miller Map COM using the Miller Indices of two reference directions for color coding
MBD M icro Beam electron D iffraction: Electron diffraction in transmission or backscattering mode with a fine-focused beam spot
MODF M is Orientation D istribution F unction
OCF O rientation C orrelation F unction
PC P attern C enter: the footpoint (x, y) of the perpendicular line from the phosphor screen to the point of beam impact on the specimen
PF P ole F igure
PF map PF constructed by marking the individual grain orientations (in color) on the reference sphere or on the Wulff’s net, i.e. the standard projection of the reference sphere.
PQ P attern Q uality: a measure of the crispness of the BKP and an indication of the perfectness of the diffracting crystal volume
RT R adon T ransform(ation), an image processing and analysis routine used to quantify gray-tone features in an image; in SEMdif Viewer the tool to locate positions of Kikuchi bands in the BKP
RHEED R eflection H igh E nergy E lectron D iffraction = BKD, in particular at steep to grazing beam incidence
Rodrigues Map COM using the Rodrigues vector as parameters for color coding
SAD S elected A rea electron D iffraction: Electron diffraction in the TEM using a selector aperture to limit the sampled area
SEM S canning E lectron M icroscope / M icroscopy
S value reciprocal value of the fraction of the coincident lattice sites of two superimposed crystal lattices
TEM T ransmission Electron M icroscope / M icroscopy
TKD / TKP T ransmission K ikuchi Diffraction / Pattern
XRD

X - Ray D iffraction


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TKD& EBSD

Pattern Solving

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Imaging Detector

Applications

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Publications

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