speed of measurement reduces demands on long-term
stability of the SEM
(FastEBSD at present more than 1000 patterns/sec acquisition
and 2000 orientations/sec indexing of pattern
cameras enable pixel binning (combination of several
pixels on the chip => increases sensitivity, reduces
volume of data transfer, increases speed). A high speed of
about 750 pattern/sec is presently achieved with a Gigabit
If intragranular structure is of
no concern, it is sufficient to acquire the orientation of
each grain only once, and iterative mesh
refinement has proven very effective by concentrating
measurement along grain boundaries. Mesh refinement is
inadequate if the microstructure contains twinned grains or
if a broad grain size distribution is present.
R.A. Schwarzer, Microscopy and Microanalysis 5, Suppl.
2 (1999) 242-243 .