EBSD and BKD
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Dynamic focusing in
an advanced BKD system

 

 

this line is in focus

Effect of focusing

 

 

this line is in focus

 

Determination of global texture

Large area measured by ACOM

Global pole figures calculated from BKD data

Crystal orientation map (COM) of a tantalum sample and pole figures, recalculated from ODF.

The full range of SEM magnifications and working distances can be used for the measurement of global texture with digital beam scan provided that the beam spot is focused dynamically and the pattern center as well as the specimen-to-screen distance of the EBSD system are calibrated automatically "on the flight".

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      R.A. Schwarzer: Automated electron backscatter diffraction - Present state and progress. Chapter 9 in A.J. Schwartz, M. Kumar, and B.L. Adams (eds.): Electron Backscatter Diffraction in Materials. Kluwer Academic / Plenum Press, New York 2000, pp. 105-122     (ISBN 0-306-46487-X)

          


Home

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TKD& EBSD

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